Datasheet

TYPICAL CHARACTERISTICS
Temperature (_C)
V
Z
, Change (%)
V
Z
= 2.5 V
I
Z
= 150 µA
50 ppm/°C
20 ppm/°C
7 ppm/°C
−0.4
0.1
0
−0.1
−0.2
−0.3
0.6
0.5
0.4
0.3
0.2
−40 0−20 12010080604020
100 1k 1M10k 100k
Frequency (Hz)
Z
Z
, Dynamic Output Impedance (Ω)
1000
100
10
1
0.1
V
Z
= 2.5 V
I
Z
= 150 µA
T
J
= 25°C
I
Z,AC
= 0.1 I
Z
X
C
No Capacitor
1 µF
Tantanlum
Capacitor
100 1k 1M10k 100k
Frequency (Hz)
Z
Z
, Dynamic Output Impedance (Ω)
1000
100
10
1
0.1
V
Z
= 2.5 V
I
Z
= 1 mA
T
J
= 25°C
I
Z,AC
= 0.1 I
Z
X
C
No Capacitor
1-µF
Tantanlum
Capacitor
0
20
40
60
80
100
120
0.0 0.5 1.0 1.5 2.0 2.5 3.0
V
Z
, Reverse Voltage (V)
I
Z
, Cathode Current (µA)
V
Z
= 2.5 V
T
J
= 25°C
0 1 2.51.5 20.5 3
1 100 100k1k 10k
Frequency (Hz)
Noise (µVP/Hz)
10
1
0.1
10
V
Z
= 2.5 V
I
Z
= 200 µA
T
J
= 25°C
−1
0
1
2
3
4
5
6
−10 0 10 20 30 40 50 60 70 80 90
V
Z
(V)
V
Z
= 2.5 V
T
J
= 25°C
R
S
= 30 kΩ
Response Time (µs)
V
IN
V
Z
V
IN
(V)
6
4
2
0
−2
−4
−6
−8
−10
−12
LM4040
SLOS456K – JANUARY 2005 – REVISED MARCH 2008 .................................................................................................................................................. www.ti.com
Figure 1. Temperature Drift for Different Average Figure 2. Output Impedance vs Frequency
Temperature Coefficients
Figure 3. Output Impedance vs Frequency Figure 4. Temperature Drift for Different Average
Temperature Coefficient
Figure 5. Noise Voltage vs Frequency Figure 6. Start-Up Characteristics
26 Submit Documentation Feedback Copyright © 2005 – 2008, Texas Instruments Incorporated