Datasheet

NRND
LM5100, LM5101
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SNVS267C MAY 2004REVISED MARCH 2005
LM5100 /LM5101 High Voltage High Side and Low Side Gate Driver
Check for Samples: LM5100, LM5101
1
FEATURES
PACKAGE
2
Drives Both a High Side and Low Side N-
SOIC-8
Channel MOSFET
WSON-10 (4 mm x 4 mm)
Independent High and Low Driver Logic Inputs
(TTL for LM5101 or CMOS for LM5100) DESCRIPTION
The LM5100/LM5101 High Voltage Gate Drivers are
Bootstrap Supply Voltage Range up to 118V
designed to drive both the high side and the low side
DC
N-Channel MOSFETs in a synchronous buck or a
Fast Propagation Times (25 ns Typical)
half bridge configuration. The floating high-side driver
Drives 1000 pF Load with 15 ns Rise and Fall
is capable of operating with supply voltages up to
Times
100V. The outputs are independently controlled with
CMOS input thresholds (LM5100) or TTL input
Excellent Propagation Delay Matching (3 ns
thresholds (LM5101). An integrated high voltage
Typical)
diode is provided to charge the high side gate drive
Supply Rail Under-voltage Lockouts
bootstrap capacitor. A robust level shifter operates at
Low Power Consumption
high speed while consuming low power and providing
clean level transitions from the control logic to the
Pin Compatible with HIP2100/HIP2101
high side gate driver. Under-voltage lockout is
provided on both the low side and the high side
TYPICAL APPLICATIONS
power rails. This device is available in the standard
Current Fed Push-pull Converters
SOIC-8 pin and the WSON-10 pin packages.
Half and Full Bridge Power Converters
Synchronous Buck Converters
Two Switch Forward Power Converters
Forward with Active Clamp Converters
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2004–2005, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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