Datasheet

UVLO
V
EE
IN_A
V
CC
V
CC
OUT_A
V
EE
OUT_B
V
EE
IN_B
LM5111
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SNVS300G JULY 2004REVISED MARCH 2013
LM5111 Dual 5A Compound Gate Driver
Check for Samples: LM5111
1
FEATURES
DESCRIPTION
The LM5111 Dual Gate Driver replaces industry
2
Independently Drives Two N-Channel
standard gate drivers with improved peak output
MOSFETs
current and efficiency. Each “compound” output driver
Compound CMOS and Bipolar Outputs Reduce
stage includes MOS and bipolar transistors operating
Output Current Variation
in parallel that together sink more than 5A peak from
capacitive loads. Combining the unique
5A Sink/3A Source Current Capability
characteristics of MOS and bipolar devices reduces
Two Channels can be Connected in Parallel to
drive current variation with voltage and temperature.
Double the Drive Current
Under-voltage lockout protection is also provided.
Independent Inputs (TTL Compatible)
The drivers can be operated in parallel with inputs
and outputs connected to double the drive current
Fast Propagation Times (25 ns Typical)
capability. This device is available in the SOIC
Fast Rise and Fall Times (14 ns/12 ns Rise/Fall
package or the thermally enhanced VSSOP package.
with 2 nF Load)
Available in Dual Non-Inverting, Dual Inverting
TYPICAL APPLICATIONS
and Combination Configurations
Synchronous Rectifier Gate Drivers
Supply Rail Under-Voltage Lockout Protection
Switch-mode Power Supply Gate Driver
(UVLO)
Solenoid and Motor Drivers
LM5111-4 UVLO Configured to Drive PFET
through OUT_A and NFET through OUT_B
PACKAGES
Pin Compatible with Industry Standard Gate
SOIC-8
Drivers
Thermally Enhanced VSSOP
Block Diagram
Figure 1. Block Diagram of LM5111
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2004–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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