Datasheet

LM8365 B A L
A: 2% THRESHOLD ACCURACY
B: 2.5% THRESHOLD ACCURACY
MF
22
BASE PART#
GRADE:
PACKAGE TYPE:
MF: SOT23-5
OUTPUT LOGIC:
L: ACTIVE LOW
H: ACTIVE HIGH
OUTPUT TYPE:
A: OPEN DRAIN
C: CMOS
RESET THRESHOLD:
22: 2.2V
27: 2.7V
30: 3.0V
45: 4.5V
LM8365
SNVS233B –MARCH 2003–REVISED APRIL 2013 www.ti.com
PIN DESCRIPTION
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ABSOLUTE MAXIMUM RATINGS
(1)(2)
Supply Voltage −0.3V to 6.5V
RESET Output Voltage −0.3V to 6.5V
RESET Output Current 70mA
Storage Temperature Range −65°C to 150°C
Mounting Temperature
Lead Temp. (Soldering 10 sec) 260°C
Junction Temperature 125°C
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test
conditions, see the Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
OPERATING RATINGS
(1)
Temperature Range −40°C to 85°C
Thermal Resistance to Ambient (θ
JA
) 265°C/W
ESD Tolerance
Human Body Model 2000V
Machine Model 200V
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test
conditions, see the Electrical Characteristics.
ELECTRICAL CHARACTERISTICS
Unless otherwise specified, all limits specified for T
A
= 25°C.
Symbol Parameter Conditions Min Typ Max Units
(1) (2) (1)
High to Low State Output
(V
IN
Decreasing)
22 Suffix 2.145 2.2 2.255
V
DET−
Detector Threshold Voltage V
27 Suffix 2.633 2.7 2.767
30 Suffix 2.925 3.0 3.075
45 Suffix 4.388 4.5 4.613
(1) All limits are specified by testing or statistical analysis.
(2) Typical values represent the most likely parametric norm.
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