Datasheet

LM96000
www.ti.com
SNAS234C APRIL 2004REVISED MARCH 2013
LM96000 Hardware Monitor with Integrated Fan Control
Check for Samples: LM96000
1
FEATURES
KEY SPECIFICATIONS
2
2-wire, SMBus 2.0 Compliant, Serial Digital
Voltage Measurement Accuracy ±2% FS (max)
Interface
Resolution 8-bits, 1°C
8-bit ΣΔ ADC
Temperature Sensor Accuracy ±3°C (max)
Monitors VCCP, 2.5V, 3.3 VSBY, 5.0V, and 12V
Temperature Range
Motherboard/processor Supplies
LM96000 Operational 0°C to +85°C
Monitors 2 Remote Thermal Diodes
Remote Temp Accuracy 0°C to +125°C
Programmable Autonomous Fan Control
Power Supply Voltage +3.0V to +3.6V
Based on Temperature Readings
Power Supply Current 0.53 mA
Noise Filtering of Temperature Reading for
Fan Control
DESCRIPTION
1.0°C Digital Temperature Sensor Resolution
The LM96000, hardware monitor, has a two wire
3 PWM Fan Speed Control Outputs
digital interface compatible with SMBus 2.0. Using an
8-bit ΣΔ ADC, the LM96000 measures:
Provides High and Low PWM Frequency
the temperature of two remote diode connected
Ranges
transistors as well as its own die
4 Fan Tachometer Inputs
the VCCP, 2.5V, 3.3VSBY, 5.0V, and 12V
Monitors 5 VID Control Lines
supplies (internal scaling resistors).
24-pin TSSOP Package
To set fan speed, the LM96000 has three PWM
XOR-tree Test Mode
outputs that are each controlled by one of three
temperature zones. High and low PWM frequency
APPLICATIONS
ranges are supported. The LM96000 includes a
digital filter that can be invoked to smooth
Desktop PC
temperature readings for better control of fan speed.
Microprocessor based equipment
The LM96000 has four tachometer inputs to measure
(e.g. Base-stations, Routers, ATMs, Point of
fan speed. Limit and status registers for all measured
Sales)
values are included.
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2All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2004–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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