Datasheet
R
G
R
G
R
F
R
F
R
O
+
-
R
O
IN-
IN+
ADC
V
+
V
-
V
O
+
-
R
T
R
S
R
M
V
S
A
V
, R
IN
a
V
CM
V
I
T
S IN
1
1) Set R
1 1
R R
DesignTarget:
M T S
2) Set R R ||R
O
F
v
I G
V
R
A
V R
#
G v
IN
v
2R (1 A )
R
2 A
#
:R R For
GM
LMH6551
www.ti.com
SNOSAK7C –FEBRUARY 2005–REVISED MARCH 2013
LMH6551 Differential, High Speed Op Amp
Check for Samples: LMH6551
1
FEATURES
DESCRIPTION
The LMH™6551 is a high performance voltage
23
• 370 MHz −3 dB Bandwidth (V
OUT
= 0.5 V
PP
)
feedback differential amplifier. The LMH6551 has the
• 50 MHz 0.1 dB Bandwidth
high speed and low distortion necessary for driving
• 2400 V/µs Slew Rate
high performance ADCs as well as the current
handling capability to drive signals over balanced
• 18 ns Settling Time to 0.05%
transmission lines like CAT 5 data cables. The
• −94/−96 dB HD2/HD3 @ 5 MHz
LMH6551 can handle a wide range of video and data
formats.
APPLICATIONS
With external gain set resistors, the LMH6551 can be
• Differential AD Driver
used at any desired gain. Gain flexibility coupled with
• Video Over Twisted Pair
high speed makes the LMH6551 suitable for use as
an IF amplifier in high performance communications
• Differential Line Driver
equipment.
• Single End to Differential Converter
The LMH6551 is available in the space saving SOIC
• High Speed Differential Signaling
and VSSOP packages.
• IF/RF Amplifier
• SAW Filter Buffer/Driver
Typical Application
Figure 1. Single Ended to Differential ADC Driver
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2LMH is a trademark of Texas Instruments.
3All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2005–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.