Datasheet

LMP91002
www.ti.com SNIS163A –APRIL 2012–REVISED MARCH 2013
Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits ensured for T
A
= 25°C, V
S
= (V
DD
– AGND), V
S
= 3.3V and AGND = DGND = 0V, V
REF
=
2.5V, Internal Zero = 20% V
REF
. Boldface limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
20
3 programmable percentages of VREF 50
67
Internal zero voltage %
TIA_ZV 20
3 programmable percentages of VDD 50
67
Internal zero voltage Accuracy ±0.04 %
Load Resistor 10 Ω
RL
Load accuracy 5 %
Internal zero 20% VREF
Power Supply Rejection Ratio at
PSRR 2.7 ≤VDD≤5.25V Internal zero 50% VREF 80 110 dB
RE pin
Internal zero 67% VREF
External reference specification
(7)
External Voltage reference range 1.5 VDD V
VREF
Input impedance 10 MΩ
(7) In case of external reference connected, the noise of the reference has to be added.
I
2
C Interface
(1)
Unless otherwise specified, all limits ensured for at T
A
= 25°C, V
S
=(VDD – AGND), 2.7V <V
S
< 3.6V and AGND = DGND =0V,
VREF= 2.5V. Boldface limits apply at the temperature extremes
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
IH
Input High Voltage 0.7*VDD V
V
IL
Input Low Voltage 0.3*VDD V
V
OL
Output Low Voltage I
OUT
=3mA 0.4 V
Hysteresis
(4)
0.1*VDD V
C
IN
Input Capacitance on all digital pins 0.5 pF
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) This parameter is specified by design or characterization.
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