Datasheet

SPI_Select
IN1_R
IN2_R
IN3_R
IN3_L
IN2_L
IN1_L
SCL/SSZ
Left
ADC
DRC
t
pl
Left
DAC
AGC
+
+
+
+
ADC
Signal
Proc.
DAC
Signal
Proc.
Right
ADC
DRC
t
pr
Right
DAC
AGC
ADC
Signal
Proc.
DAC
Signal
Proc.
+
+
+
+
Vol. Ctrl
Vol. Ctrl
Data
Interface
Gain Adj.
Gain Adj.
0…
+47.5 dB
0.5 dB steps
0…+47.5 dB
0.5 dB
steps
-6...+29dB
1dB steps
-6...+29dB
1dB steps
-6...+29dB
1dB steps
-6...+29dB
1dB steps
SPI / I2C
Control Block
Pin Muxing/ Clock Routing
Secondary
I
2
S IF
Primary
I
2
S Interface
Interrupt
Ctrl
ALDO
DLDO
PLL
Ref
Ref
LDO Select
Supplies
LDO in
HPVdd
DVdd
AVdd
IOVdd
AVss
DVss
IOVss
SDA/MOSI
MISO
SCLK
MCLK
GPIO
DOUT
DIN
BCLK
WCLK
miniDSP miniDSP
HPL
LOL
HPR
LOR
Reset
-30...0 dB
-30...0 dB
-72...0dB
-72...0dB
´ ´
´´
PCM3070
www.ti.com
SLAS724 FEBRUARY 2011
Stereo Audio Codec With Embedded miniDSP
Check for Samples: PCM3070
1
FEATURES
APPLICATIONS
Soundbar
Stereo Audio DAC with 100dB SNR
Flat Panel Television
Stereo Audio ADC with 93dB SNR
MP3 Docking stations
Extensive Signal Processing Options
Cell Phone Docking Stations
Embedded miniDSP
Other Stereo or 2.1 Home Audio systems
Six Single-Ended or 3 Fully-Differential Analog
Inputs
DESCRIPTION
Stereo Headphone Outputs
The PCM3070 is a flexible stereo audio codec with
Stereo Line Outputs
programmable inputs and outputs,
Very Low-Noise PGA
fully-programmable miniDSP, fixed predefined and
parameterizable signal processing blocks, integrated
Analog Bypass Mode
PLL, integrated LDOs and flexible digital interfaces.
Programmable PLL
Integrated LDO
5mm x 5mm 32-pin QFN Package
Figure 1. Simplified Block Diagram
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
© 2011, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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