Datasheet

SCANSTA101
www.ti.com
SNLS057J MAY 2002REVISED APRIL 2013
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
Check for Samples: SCANSTA101
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FEATURES
DESCRIPTION
The SCANSTA101 is designed to function as a test
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Compatible with IEEE Std. 1149.1 (JTAG) Test
master for an IEEE 1149.1 boundary scan test
Access Port and Boundary Scan Architecture
system. It is suitable for use in embedded IEEE
Supported by Texas Instruments' SCAN Ease
1149.1 applications and as a component in a stand-
(SCAN Embedded Application Software
alone boundary scan tester.
Enabler) Software Rev 2.0
The SCANSTA101 is an enhanced version of, and a
Uses Generic, Asynchronous Processor
replacement for, the SCANPSC100. The
Interface; Compatible with a Wide Range of
SCANSTA101 supports the IEEE 1149.1 Test Access
Processors and Processor Clock (PCLK)
Port (TAP) standard and the IEEE 1532 standard for
Frequencies
in-system configuration of programmable devices.
16-Bit Data Interface (IP Scalable to 32-bit)
The SCANSTA101 improves test vector throughput
2k x 32 Bit Dual-Port Memory
and reduces software overhead in the system
processor. The SCANSTA101 presents a simple,
Load-on-the-Fly (LotF) and Preloaded Vector
register-based interface to the system processor.
Operating Modes Supported
Texas Instruments provides C-language source code
On-Board Sequencer Allows Multi-Vector
which can be included in the embedded system
Operations such as those Required to Load
software. The combination of the SCANSTA101 and
Data Into an FPGA
its support software comprises a simple API for
boundary scan operations.
On-Board Compares Support Test Data In
(TDI) Validation Against Preloaded Expected
The interface from the SCANSTA101 to the system
Data
processor is implemented by reading and writing
registers, some of which map to locations in the
32-Bit Linear Feedback Shift Register (LFSR)
SCANSTA101 memory. Hardware handshaking and
at the Test Data In (TDI) Port for Signature
interrupt lines are provided as part of the processor
Compression
interface.
State, Shift, and BIST Macros Allow
The SCANSTA101 is available as a stand-alone
Predetermined Test Mode Select (TMS)
device packaged in a 49-pin NFBGA package. It is
Sequences to be Utilized
also available as an IP macro for synthesis in
Operates at 3.3 V Supply Voltages with 5 V
programmable logic devices.
Tolerant I/O
Outputs Support Power-Down TRI-STATE
Mode.
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2002–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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