Datasheet

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TXD
GND
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S
CANH
CANL
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ref
SN65HVD1050-EP
www.ti.com
SLLS772A DECEMBER 2006REVISED OCTOBER 2009
EMC OPTIMIZED CAN TRANSCEIVER
Check for Samples :SN65HVD1050-EP
1
FEATURES
D PACKAGE
2
Controlled Baseline
(TOP VIEW)
One Assembly/Test Site, One Fabrication
Site
Enhanced Diminishing Manufacturing Sources
(DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
(1)
DESCRIPTION/
Improved Replacement for the TJA1050
ORDERING INFORMATION
High Electromagnetic Immunity (EMI)
Very Low Electromagnetic Emissions (EME) The SN65HVD1050 meets or exceeds the
specifications of the ISO 11898 standard for use in
Meets or Exceeds the Requirements of
applications employing a controller area network
ISO 11898-2
(CAN). The device is also qualified for use in
Bus-Fault Protection of –27 V to 40 V
automotive applications in accordance with
AEC-Q100.
(2)
Dominant Time-Out Function
Thermal Shutdown Protection
As a CAN transceiver, this device provides differential
transmit capability to the bus and differential receive
Power-Up/Down Glitch-Free Bus Inputs and
capability to a CAN controller at signaling rates up to
Outputs
1 megabit per second (Mbps)
(3)
.
High Input Impedance With Low V
CC
Designed for operation in especially harsh
Monotonic Outputs During Power Cycling
environments, the SN65HVD1050 features
cross-wire, overvoltage, and loss of ground protection
APPLICATIONS
from –27 V to 40 V, overtemperature protection, a
Industrial Automation
–12-V to 12-V common-mode range, and withstands
DeviceNET™ Data Buses (Vendor ID #806)
voltage transients from –200 V to 200 V, according to
ISO 7637.
SAE J2284 High-Speed CAN for Automotive
Applications
Pin 8 provides for two different modes of operation:
SAE J1939 Standard Data Bus Interface
high-speed or silent mode. The high-speed mode of
ISO 11783 Standard Data Bus Interface
operation is selected by connecting S (pin 8) to
ground.
NMEA 2000 Standard Data Bus Interface
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85, (2) The device is available with Q100 qualification as the
temperature cycle, autoclave or unbiased HAST, SN65HVD1050Q (Product Preview).
electromigration, bond intermetallic life, and mold compound (3) The signaling rate of a line is the number of voltage
life. Such qualification testing should not be viewed as transitions that are made, per second, expressed in the units
justifying use of this component beyond specified bps (bits per second).
performance and environmental limits. blk
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ORDERING INFORMATION
PART NUMBER PACKAGE MARKED AS ORDERING NUMBER
SN65HVD1050M SOIC-8 1050EP SN65HVD1050MDREP (reel)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2DeviceNET is a trademark of Open Devicenet Vendors Association, Inc.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006–2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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