Datasheet

Silent Mode
Over-Temperature
Sensor
Dominant
Time Out
Driver
V
CC
2
V
CC
/2
30 µA
V
CC
3
1
4
TXD
RXD
8
5
7
6
S
V
ref
CANH
CANL
30 µA
SN65HVD1050-Q1
www.ti.com
SLLS696C MAY 2006REVISED DECEMBER 2010
EMC-OPTIMIZED CAN TRANSCEIVER
Check for Samples: SN65HVD1050-Q1
1
FEATURES
APPLICATIONS
GMW3122 Dual-Wire CAN Physical Layer
2
Qualified for Automotive Applications
SAE J2284 High-Speed CAN for Automotive
Customer-Specific Configuration Control Can
Applications
Be Supported Along With Major-Change
SAE J1939 Standard Data Bus Interface
Approval
ISO 11783 Standard Data Bus Interface
Improved Drop-In Replacement for TJA1050
NMEA 2000 Standard Data Bus Interface
Meets or Exceeds the Requirements of
Industrial Automation
ISO 11898-2
DeviceNet™ Data Buses (Vendor ID #806)
GIFT/ICT Compliant
ESD Protection up to ±8 kV (Human-Body
DESCRIPTION
Model) on Bus Pins
The SN65HVD1050 meets or exceeds the
High Electromagnetic Immunity (EMI)
specifications of the ISO 11898 standard for use in
Low Electromagnetic Emissions (EME)
applications employing a Controller Area Network
Bus-Fault Protection of –27 V to 40 V
(CAN). The device is qualified for use in automotive
applications.
Dominant Time-Out Function
Thermal Shutdown Protection
As a CAN transceiver, this device provides differential
transmit capability to the bus and differential receive
Power-Up/Down Glitch-Free Bus Inputs and
capability to a CAN controller at signaling rates up to
Outputs
1 megabit per second (Mbps)
(1)
.
High Input Impedance With Low V
CC
(1) The signaling rate of a line is the number of voltage
Monotonic Outputs During Power Cycling
transitions that are made per second expressed in the units
bps (bits per second).
FUNCTION BLOCK DIAGRAM
1
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Copyright © 2006–2010, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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