Datasheet

SN74AHCT245 . . . DB, DGV, DW, N, NS,
OR PW PACKAGE
(TOP VIEW)
3 2 1 20 19
9
10 11 12 13
4
5
6
7
8
18
17
16
15
14
B1
B2
B3
B4
B5
A3
A4
A5
A6
A7
A2
A1
DIR
B7
B6 OE
A8
GND
B8
V
CC
SN54AHCT245 . . . FK PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
DIR
A1
A2
A3
A4
A5
A6
A7
A8
GND
V
CC
OE
B1
B2
B3
B4
B5
B6
B7
B8
SN74AHCT245 . . . RGY PACKAGE
(TOP VIEW)
1 20
10 11
2
3
4
5
6
7
8
9
19
18
17
16
15
14
13
12
OE
B1
B2
B3
B4
B5
B6
B7
A1
A2
A3
A4
A5
A6
A7
A8
DIR
B8
V
GND
CC
SN54AHCT245 . . . J OR W PACKAGE
SN74AHCT245
SN54AHCT245
www.ti.com
SCLS233O OCTOBER 1995REVISED AUGUST 2013
OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
Check for Samples: SN74AHCT245, SN54AHCT245
1
FEATURES
DESCRIPTION
These octal bus transceivers are designed for
Inputs Are TTL-Voltage Compatible
asynchronous two-way communication between data
Latch-Up Performance Exceeds 250 mA Per
buses. The control-function implementation minimizes
JESD 17
external timing requirements.
ESD Protection Exceeds JESD 22
The ’AHCT245 devices allow data transmission from
2000-V Human-Body Model (A114-A)
the A bus to the B bus or from the B bus to the A
bus, depending on the logic level at the direction-
200-V Machine Model (A115-A)
control (DIR) input. The output-enable (OE) input can
1000-V Charged-Device Model (C101)
be used to disable the device so that the buses
effectively are isolated.
To ensure the high-impedance state during power up
or power down, OE should be tied to V
CC
through a
pullup resistor; the minimum value of the resistor is
determined by the current-sinking capability of the
driver.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 1995–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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