Datasheet

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FEATURES
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1OE
1A
1Y
2OE
2A
2Y
GND
V
CC
4OE
4A
4Y
3OE
3A
3Y
D, DGV, NS, OR PW PACKAGE
(TOP VIEW)
DESCRIPTION/ORDERING INFORMATION
1
1OE
2
1A 1Y
3
4
2OE
5
2A 2Y
6
10
3OE
9
3A 3Y
8
13
4OE
12
4A 4Y
11
SN74ALVC126
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
SCES111J JULY 1997 REVISED OCTOBER 2004
Operates From 1.65 V to 3.6 V
Max t
pd
of 3.1 ns at 3.3 V
± 24-mA Output Drive at 3.3 V
Latch-Up Performance Exceeds 250 mA Per
JESD 17
ESD Performance Tested Per JESD 22
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
1000-V Charged-Device Model (C101)
This quadruple bus buffer gate is designed for 1.65-V to 3.6-V V
CC
operation.
The SN74ALVC126 features independent line drivers with 3-state outputs. Each output is disabled when the
associated output-enable (OE) input is low.
To ensure the high-impedance state during power up or power down, OE should be tied to GND through a
pulldown resistor; the minimum value of the resistor is determined by the current-sourcing capability of the driver.
ORDERING INFORMATION
T
A
PACKAGE
(1)
ORDERABLE PART NUMBER TOP-SIDE MARKING
Tube SN74ALVC126D
SOIC D ALVC126
Tape and reel SN74ALVC126DR
-40 ° C to 85 ° C SOP NS Tape and reel SN74ALVC126NSR ALVC126
TSSOP PW Tape and reel SN74ALVC126PWR VA126
TVSOP DGV Tape and reel SN74ALVC126DGVR VA126
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
FUNCTION TABLE
(each buffer)
INPUTS
OUTPUT
Y
OE A
H H H
H L L
L X Z
LOGIC DIAGRAM (POSITIVE LOGIC)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 1997–2004, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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