Datasheet
1
FEATURES
DCT OR DCU PACKAGE
(TOP VIEW)
1
2
3
4
8
7
6
5
COM
INH
GND
GND
V
CC
Y1
Y2
A
YZP PACKAGE
Bump View
1
2
B
C
D
A
Laser Marking View
2
1
B
C
D
A
DESCRIPTION/ORDERING INFORMATION
SN74AUC2G53
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................................................................................................................................................ SCES484C – AUGUST 2003 – REVISED JANUARY 2009
SINGLE-POLE DOUBLE-THROW (SPDT) ANALOG SWITCH OR
2:1 ANALOG MULTIPLEXER/DEMULTIPLEXER
2
• Available in the Texas Instruments NanoFree™
Package
• Operates at 0.8 V to 2.7 V
• Sub-1-V Operable
• Low Power Consumption, 10 µ A at 2.7 V
• High On-Off Output Voltage Ratio
• High Degree of Linearity
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
YZP TERMINAL ASSIGNMENTS
D GND A
C GND Y2
B INH Y1
A COM V
CC
1 2
This analog switch is operational at 0.8-V to 2.7-V V
CC
, but is designed specifically for 1.1-V to 2.7-V V
CC
operation.
The SN74AUC2G53 can handle both analog and digital signals. The device permits signals with amplitudes of up
to V
CC
(peak) to be transmitted in either direction.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for
analog-to-digital and digital-to-analog conversion systems.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2 NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003 – 2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.