Datasheet
See mechanical drawings for dimensions.
NC – No internal connection
DBV PACKAGE
(TOP VIEW)
2
5
3
4
Y
1
B
GND
A
V
CC
DCK PACKAGE
(TOP VIEW)
3
4
GND
2
B
Y
1
A
5
V
CC
DRL PACKAGE
(TOP VIEW)
2
B
1
A
3
4
GND
Y
5
V
CC
YZP PACKAGE
(BOTTOM VIEW)
2
B
1
A
GND
4
3
Y
5
V
CC
DRY PACKAGE
(TOP VIEW)
B NC
A
6
5
4
2
3
GND
Y
V
CC
1
6
5
4
2
3
1
DSF PACKAGE
(TOP VIEW)
B
A
GND
NC
Y
V
CC
SN74LVC1G00
www.ti.com
SCES212Z –APRIL 1999–REVISED SEPTEMBER 2013
Single 2-Input Positive-NAND Gate
Check for Samples: SN74LVC1G00
1
FEATURES
DESCRIPTION
This single 2-input positive-NAND gate is designed
2
• Available in the Texas Instruments NanoStar™
for 1.65-V to 5.5-V V
CC
operation.
Package
The SN74LVC1G00 performs the Boolean function Y
• Supports 5-V V
CC
Operation
= A ● B or Y = A + B in positive logic.
• Inputs Accept Voltages to 5.5 V
NanoStar™ package technology is a major
• Provides Down Translation to V
CC
breakthrough in IC packaging concepts, using the die
• Max t
pd
of 3.8 ns at 3.3 V
as the package.
• Low Power Consumption, 10-μA Max I
CC
This device is fully specified for partial-power-down
• ±24-mA Output Drive at 3.3 V
applications using I
off
. The I
off
circuitry disables the
• I
off
Supports Live Insertion, Partial-Power-
outputs, preventing damaging current backflow
Down Mode, and Back Drive Protection
through the device when it is powered down.
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 1000-V Charged-Device Model (C101)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2NanoStar is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 1999–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.