Datasheet

www.ti.com
FEATURES
DBV OR DCK PACKAGE
(TOP VIEW)
1
2
3
5
4
A
B
GND
V
CC
Y
DESCRIPTION/ORDERING INFORMATION
1
2
4
A
B
Y
SN74LVC1G00-EP
SINGLE 2-INPUT POSITIVE-NAND GATE
SCES450D DECEMBER 2003 REVISED SEPTEMBER 2006
Controlled Baseline I
off
Supports Partial-Power-Down Mode
Operation
One Assembly/Test Site, One Fabrication
Site Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
Enhanced Diminishing Manufacturing
Sources (DMS) Support ESD Protection Exceeds JESD 22
Enhanced Product-Change Notification 2000-V Human-Body Model (A114-A)
Qualification Pedigree
(1)
200-V Machine Model (A115-A)
Supports 5-V V
CC
Operation 1000-V Charged-Device Model (C101)
Inputs Accept Voltages to 5.5 V
Max t
pd
of 3.8 ns at 3.3 V
Low Power Consumption, 10- µ A Max I
CC
± 24-mA Output Drive at 3.3 V
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
This single 2-input positive-NAND gate is designed for 1.65-V to 5.5-V V
CC
operation.
The SN74LVC1G00 performs the Boolean function Y = A B or Y = A + B in positive logic.
This device is fully specified for partial-power-down applications using I
off
. The I
off
circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION
T
A
PACKAGE
(1)
ORDERABLE PART NUMBER TOP-SIDE MARKING
(2)
–40 ° C to 85 ° C SOP (SC-70) DCK Reel of 3000 SN74LVC1G00IDCKREP CAO
SOP DBV Reel of 3000 SN74LVC1G00MDBVREP SBFM
–55 ° C to 125 ° C
SOP (SC-70) DCK Reel of 3000 SN74LVC1G00MDCKREP BYA
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2) The actual top-side marking has one additional character that designates the assembly/test site.
FUNCTION TABLE
INPUTS
OUTPUT
Y
A B
H H L
L X H
X L H
LOGIC DIAGRAM (POSITIVE LOGIC)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2006, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

Summary of content (15 pages)