Datasheet
See mechanical drawings for dimensions.
NC – No internal connection
DBV PACKAGE
(TOP VIEW)
2
5
3
4
Y
1
B
GND
A
V
CC
DCK PACKAGE
(TOP VIEW)
3
4
GND
2
B
Y
1
A
5
V
CC
DRL PACKAGE
(TOP VIEW)
2
B
1
A
3
4
GND
Y
5
V
CC
YZP PACKAGE
(BOTTOM VIEW)
2
B
1
A
GND
4
3
Y
5
V
CC
DRY PACKAGE
(TOP VIEW)
B NC
A
6
5
4
2
3
GND
Y
V
CC
1
6
5
4
2
3
1
DSF PACKAGE
(TOP VIEW)
B
A
GND
NC
Y
V
CC
A
GND
DPK PACKAGE
(TOP VIEW)
B
V
CC
Y
5
4
2
3
1
Y = A + B or Y = •A B
SN74LVC1G32
www.ti.com
SCES219S –APRIL 1999–REVISED JULY 2013
SINGLE 2-INPUT POSITIVE-OR GATE
Check for Samples: SN74LVC1G32
1
FEATURES
DESCRIPTION
This single 2-input positive-OR gate is designed for
2
• Available in the Texas Instruments NanoStar™
1.65-V to 5.5-V V
CC
operation.
and NanoFree™ Packages
The SN74LVC1G32 performs the Boolean function
• Supports 5-V V
CC
Operation
in positive logic.
• Inputs Accept Voltages to 5.5 V
NanoStar™ and NanoFree™ package technology is
• Max t
pd
of 3.6 ns at 3.3 V
a major breakthrough in IC packaging concepts,
• Low Power Consumption, 10-μA Max I
C C
using the die as the package.
• ±24-mA Output Drive at 3.3 V
This device is fully specified for partial-power-down
• I
off
Supports Partial-Power-Down Mode
applications using I
off
. The I
off
circuitry disables the
Operation
outputs, preventing damaging current backflow
• Latch-Up Performance Exceeds 100 mA Per
through the device when it is powered down.
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 1999–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.