Datasheet
3
2
4
51
A V
CC
C
B
GND
DBV PACKAGE
(TOP VIEW)
YZP PACKAGE
(BOTTOM VIEW)
DCK PACKAGE
(TOP VIEW)
3
2
4
51
A V
CC
C
B
GND
3
2
4
51
A V
CC
C
B
GND
A
GND
V
CC
C
B
DRL PACKAGE
(TOP VIEW)
See mechanical drawings for dimensions.
1
4
2
3
5
DRY PACKAGE
(TOP VIEW)
B NC
A
6
5
4
2
3
GND
C
V
CC
1
A
GND
DSF PACKAGE
(TOP VIEW)
B
V
CC
C
NC
6
5
4
2
3
1
SN74LVC1G66
www.ti.com
SCES323N –JUNE 2001–REVISED NOVEMBER 2012
SINGLE BILATERAL ANALOG SWITCH
Check for Samples: SN74LVC1G66
1
FEATURES
2
• Available in the Texas Instruments NanoFree™
• Low On-State Resistance, Typically ≉≉5.5 Ω
Package (V
CC
= 4.5 V)
• 1.65-V to 5.5-V V
CC
Operation • Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• Inputs Accept Voltages to 5.5 V
• ESD Protection Exceeds JESD 22
• Max t
pd
of 0.8 ns at 3.3 V
– 2000-V Human-Body Model (A114-A)
• High On-Off Output Voltage Ratio
– 200-V Machine Model (A115-A)
• High Degree of Linearity
– 1000-V Charged-Device Model (C101)
• High Speed, Typically 0.5 ns
(V
CC
= 3 V, C
L
= 50 pF)
DESCRIPTION/ORDERING INFORMATION
This single analog switch is designed for 1.65-V to 5.5-V V
CC
operation.
The SN74LVC1G66 can handle both analog and digital signals. The device permits signals with amplitudes of up
to 5.5 V (peak) to be transmitted in either direction.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for
analog-to-digital and digital-to-analog conversion systems.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2001–2012, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.