Datasheet
YZV PACKAGE
(TOP VIEW)
A
GND Y
V
CC
A1
A2
B1 B2
DNU – Do not use
YZP PACKAGE
(TOP VIEW)
A
GND
DNU
V
CC
Y
C2C1
B1 B2
A1 A2
See mechanical drawings for dimensions.
N.C. – No internal connection
DBV PACKAGE
(TOP VIEW)
3
4
GND
2
A
Y
V
CC
5
1
N.C.
DCK PACKAGE
(TOP VIEW)
3
4
GND
2
A
Y
5
1
N.C.
V
CC
DRL PACKAGE
(TOP VIEW)
2
A
V
CC
5
1
N.C.
3
4
GNDGND
Y
DRY PACKAGE
(TOP VIEW)
A N.C.
N.C.
6
5
4
2
3
GND
Y
V
CC
1
N.C.
GND
DSF PACKAGE
(TOP VIEW)
A
V
CC
Y
N.C.
6
5
4
2
3
1
SN74LVC1GU04
www.ti.com
SCES215V –APRIL 1999–REVISED NOVEMBER 2013
Single Inverter Gate
Check for Samples: SN74LVC1GU04
1
FEATURES
DESCRIPTION
This single inverter gate is designed for 1.65-V to 5.5-
2
• Available in the Texas Instruments NanoFree™
V V
CC
operation.
Package
The SN74LVC1GU04 contains one inverter with an
• Supports 5-V V
CC
Operation
unbuffered output and performs the Boolean function
• Inputs Accept Voltages to 5.5 V
Y = A.
• Unbuffered Output
NanoFree™ package technology is a major
• Max t
pd
of 3.7 ns at 3.3 V
breakthrough in IC packaging concepts, using the die
• Low Power Consumption, 10-μA Max I
CC
as the package.
• ±24-mA Output Drive at 3.3 V
• I
off
Supports Live Insertion, Partial Power
Down Mode, and Back Drive Protection
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
YZP Package Terminal Assignments
1 2
A DNU V
CC
B A No ball
C GND Y
YZV Package Terminal Assignments
1 2
A A V
CC
B GND Y
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 1999–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.