Datasheet

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FEATURES
3
2
4
61
1A 1Y
2Y
GND
2A
DBV PACKAGE
(TOP VIEW)
YZP PACKAGE
(BOTTOM VIEW)
DCK PACKAGE
(TOP VIEW)
3
2
4
61
1A 1Y
2Y
GND
2A
3
2
4
61
1A 1Y
2Y
GND
2A
1A
2A
1Y
2Y
GND
DRL PACKAGE
(TOP VIEW)
See mechanical drawings for dimensions.
1
4
2
3
6
V
CC
V
CC
V
CC
5
V
CC
5
5
5
DESCRIPTION/ORDERING INFORMATION
SN74LVC2G34
DUAL BUFFER GATE
SCES359H AUGUST 2001 REVISED FEBRUARY 2007
Available in the Texas Instruments Typical V
OHV
(Output V
OH
Undershoot)
NanoFree™ Package >2 V at V
CC
= 3.3 V, T
A
= 25 ° C
Supports 5-V V
CC
Operation I
off
Supports Partial-Power-Down Mode
Operation
Inputs Accept Voltages to 5.5 V
Latch-Up Performance Exceeds 100 mA Per
Max t
pd
of 4.1 ns at 3.3 V
JESD 78, Class II
Low Power Consumption, 10- µ A Max I
CC
ESD Protection Exceeds JESD 22
± 24-mA Output Drive at 3.3 V
2000-V Human-Body Model (A114-A)
Typical V
OLP
(Output Ground Bounce)
200-V Machine Model (A115-A)
<0.8 V at V
CC
= 3.3 V, T
A
= 25 ° C
1000-V Charged-Device Model (C101)
This dual buffer gate is designed for 1.65-V to 5.5-V V
CC
operation. The SN74LVC2G34 performs the Boolean
function Y = A in positive logic.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
This device is fully specified for partial-power-down applications using I
off
. The I
off
circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION
T
A
PACKAGE
(1)
ORDERABLE PART NUMBER TOP-SIDE MARKING
(2)
NanoFree™ WCSP (DSBGA)
Reel of 3000 SN74LVC2G34YZPR _ _ _C9_
0.23-mm Large Bump YZP (Pb-free)
Reel of 3000 SN74LVC2G34DBVR
SOT (SOT-23) DBV C34_
Reel of 250 SN74LVC2G34DBVT
–40 ° C to 85 ° C
Reel of 3000 SN74LVC2G34DCKR
SOT (SC-70) DCK C9_
Reel of 250 SN74LVC2G34DCKT
SOT (SOT-533) DRL Reel of 4000 SN74LVC2G34DRLR C9_
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2) DBV/DCK/DRL: The actual top-side marking has one additional character that designates the assembly/test site.
YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb, = Pb-free).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2001–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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