Datasheet

3A
3
2
5
81
1A V
CC
3Y
GND
DCT PACKAGE
(TOP VIEW)
YZP PACKAGE
(BOTTOM VIEW)
DCU PACKAGE
(TOP VIEW)
3
2
4 5
1
1A V
CC
1Y3Y
GND
3Y
GND
V
CC
2Y
2A
See mechanical drawings for dimensions.
2
5
3
4
8
2A 3A
2Y
2A
1Y
2Y
4
6
7
6
7
8
6
1
7
1A
3A
1Y
SN74LVC3G04
www.ti.com
SCES363L AUGUST 2001REVISED NOVEMBER 2013
Triple Inverter Gate
Check for Samples: SN74LVC3G04
1
FEATURES
DESCRIPTION
This triple inverter is designed for 1.65-V to 5.5-V V
CC
2
Available in the Texas Instruments NanoFree™
operation. The SN74LVC3G04 device performs the
Package
Boolean function Y = A.
Supports 5-V V
CC
Operation
NanoFree™ package technology is a major
Inputs Accept Voltages to 5.5 V
breakthrough in IC packaging concepts, using the die
Max t
pd
of 4.1 ns at 3.3 V
as the package.
Low Power Consumption, 10-µA Max I
CC
This device is fully specified for partial-power-down
±24-mA Output Drive at 3.3 V
applications using I
off
. The I
off
circuitry disables the
outputs, preventing damaging current backflow
Typical V
OLP
(Output Ground Bounce)
through the device when it is powered down.
<0.8 V at V
CC
= 3.3 V, T
A
= 25 ° C
Typical V
OHV
(Output V
OH
Undershoot)
>2 V at V
CC
= 3.3 V, T
A
= 25 ° C
I
off
Supports Live Insertion, Partial-Power-
Down Mode, and Back-Drive Protection
Can Be Used as a Down Translator to
Translate Inputs From a Max of 5.5 V Down to
the V
CC
Level
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Protection Exceeds JESD 22
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
1000-V Charged-Device Model (C101)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2001–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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