Datasheet

TL3016, TL3016Y
ULTRA-FAST LOW-POWER
PRECISION COMPARATORS
SLCS130D – MARCH 1997 – REVISED MARCH 2000
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Ultrafast Operation . . . 7.6 ns (Typ)
Low Positive Supply Current
10.6 mA (Typ)
Operates From a Single 5-V Supply or From
a Split ±5-V Supply
Complementary Outputs
Low Offset Voltage
No Minimum Slew Rate Requirement
Output Latch Capability
Functional Replacement to the LT1016
description
The TL3016 is an ultrafast comparator designed
to interface directly to TTL logic while operating
from either a single 5-V power supply or dual
±5-V supplies. It features extremely tight offset
voltage and high gain for precision applications. It
has complementary outputs that can be latched
using the LATCH ENABLE terminal. Figure 1
shows the positive supply current of this
comparator. The TL3016 only requires 10.6 mA
(typical) to achieve a propagation delay of 7.6 ns.
The TL3016 is a pin-for-pin functional replace-
ment for the LT1016 comparator, offering higher
speed operation but consuming half the power.
AVAILABLE OPTIONS
PACKAGED DEVICES
CHIP
T
A
SMALL
OUTLINE
(D)
TSSOP
(PW)
CHIP
FORM
(Y)
0°C to 70°C TL3016CD TL3016CPWLE TL3016Y
–40°C to 85°C TL3016ID TL3016IPWLE
The PW packages are available left-ended taped and reeled only.
Chip forms are tested at T
A
= 25°C only.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
8
7
6
5
V
CC+
IN+
IN
V
CC–
Q OUT
Q OUT
GND
LATCH ENABLE
D AND PW PACKAGE
(TOP VIEW)
Figure 1
– 50 – 25 0 25 50 75 100 125
9
7
6
13
14
POSITIVE SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
15
12
11
8
5
10
– Positive Supply Current – mA
I
CC
T
A
– Free-Air Temperature – °C
symbol (each comparator)
IN+
IN
Q
OUT
Q OUT
V
CC
= ± 5 V
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 2000, Texas Instruments Incorporated

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