Datasheet

C
LOAD
R
LOAD
C
RAMP
C
FLT
3
4
TPS2350
11
10
7
9
8
RTN
GAT
SENSE
SOURCE
GATA
GATB
–VINB–VINARAMPFLTTIM
OV
UV
–VINB
–VINA
Q1
1
5 6 14 13
12
PG
2
FLT
Power Good
Fault
R
SENSE
0.01
D
1
(A)
TPS2350
www.ti.com
SLUS574D JULY 2003REVISED OCTOBER 2013
Hot Swap Power Manager for Redundant –48-V Supplies
Check for Samples: TPS2350
1
FEATURES
DESCRIPTION
Replaces OR-ing Diodes
The TPS2350 is a hot swap power manager
Operating Supply Range of –12 V to –80 V
optimized for replacing OR-ing diodes in redundant
Withstands Transients to –100 V
power –48-V systems. The TPS2350 operates with
supply voltages from –12 V to –80 V, and withstands
Programmable Current Limit
spikes to –100 V.
Programmable Linear Inrush Slew Rate
The TPS2350 uses two power FETs as low voltage
Programmable UV/OV Thresholds
drop diodes to efficiently select between two
Programmable UV and OV Hysteresis
redundant power supplies. This minimizes system
Fault Timer to Eliminate Nuisance Trips
power dissipation and also minimizes voltage drop
through the power management chain.
Power Good and Fault Outputs
14-Pin SOIC and TSSOP Package
The TPS2350 also uses a third power FET to provide
load current slew rate control and peak current
limiting that is programmed by one resistor and one
APPLICATIONS
capacitor. The device also provides a power good
–48-V Distributed Power Systems
output to enable down-stream power converters and
Central Office Switching
a fault output to indicate load problems.
ONET
Base Stations
TYPICAL APPLICATION DIAGRAM
A. D1 optional per application requirements.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

Summary of content (27 pages)