Datasheet
1
FEATURES
APPLICATIONS
TPS736xx
GNDEN NR
IN OUT
V
IN
V
OUT
Optional Optional
Optional
Typical Application Circuit for Fixed-Voltage Versions
N/C-Nointernalconnection
TPS73601-EP , TPS73615-EP , TPS73618-EP
TPS73625-EP , TPS73630-EP , TPS73632-EP , TPS73633-EP
www.ti.com
.................................................................................................................................................. SGLS326C – APRIL 2006 – REVISED FEBRUARY 2009
CAP-FREE NMOS 400 mA LOW-DROPOUT REGULATORS
WITH REVERSE CURRENT PROTECTION
– Adjustable Output from 1.2 V to 5.5 V
2
• Controlled Baseline – Custom Outputs Available
– One Assembly
– One Test Site
• Portable/Battery-Powered Equipment
– One Fabrication Site
• Post-Regulation for Switching Supplies
• Extended Temperature Performance of
• Noise-Sensitive Circuitry Such as VCOs
– 55 ° C to 125 ° C
• Point of Load Regulation for DSPs, FPGAs,
• Enhanced Diminishing Manufacturing Sources
ASICs, and Microprocessors
(DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
(1)
• Stable With No Output Capacitor or Any Value
or Type of Capacitor
• Input Voltage Range of 1.7 V to 5.5 V
• Ultra-Low Dropout Voltage: 75 mV Typical
• Excellent Load Transient Response — With or
Without Optional Output Capacitor
• New NMOS Topology Delivers Low Reverse
Leakage Current
• Low Noise: 30 µ V
RMS
Typical
(10 Hz to 100 kHz)
• 0.5% Initial Accuracy
• 1% Overall Accuracy Over Line, Load, and
Temperature
• Less Than 1- µ A Max I
Q
in Shutdown Mode
• Thermal Shutdown and Specified Min/Max
Current Limit Protection
• Available in Multiple Output Voltage Versions
– Fixed Outputs of 1.2 V to 3.3 V
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2 All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006 – 2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.