Datasheet
1
FEATURES
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
C1+
V
S+
C1−
C2+
C2−
V
S−
DOUT2
RIN2
V
CC
GND
DOUT1
RIN1
ROUT1
DIN1
DIN2
ROUT2
D, DW, N, NS, OR PW PACKAGE
(TOP VIEW)
APPLICATIONS
DESCRIPTION/ORDERING INFORMATION
TRS232E
www.ti.com
................................................................................................................................................. SLLS791C – JUNE 2007 – REVISED SEPTEMBER 2008
DUAL RS-232 DRIVER/RECEIVER
WITH IEC61000-4-2 PROTECTION
2
• Meets or Exceeds TIA/RS-232-F and ITU
Recommendation V.28
• Operates From a Single 5-V Power Supply
With 1.0- µ F Charge-Pump Capacitors
• Operates up to 250 kbit/s
• Two Drivers and Two Receivers
• ± 30-V Input Levels
• Low Supply Current . . . 8 mA Typical
• ESD Protection for RS-232 Bus Pins
– ± 15-kV Human-Body Model (HBM)
– ± 8-kV IEC61000-4-2, Contact Discharge
– ± 15-kV IEC61000-4-2, Air-Gap Discharge
• TIA/RS-232-F
• Battery-Powered Systems
• Terminals
• Modems
• Computers
The TRS232E is a dual driver/receiver that includes a capacitive voltage generator to supply TIA/RS-232-F
voltage levels from a single 5-V supply. Each receiver converts TIA/RS-232-F inputs to 5-V TTL/CMOS levels.
This receiver has a typical threshold of 1.3 V, a typical hysteresis of 0.5 V, and can accept ± 30-V inputs. Each
driver converts TTL/CMOS input levels into TIA/RS-232-F levels. The driver, receiver, and voltage-generator
functions are available as cells in the Texas Instruments LinASIC™ library.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2 LinASIC is a trademark of Texas Instruments.
UNLESS OTHERWISE NOTED this document contains
Copyright © 2007 – 2008, Texas Instruments Incorporated
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.