Datasheet

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UCC27321-Q1, UCC27322-Q1
www.ti.com
SLUSA13C FEBRUARY 2010REVISED MARCH 2012
SINGLE 9-A HIGH-SPEED LOW-SIDE MOSFET DRIVER WITH ENABLE
Check for Samples: UCC27321-Q1, UCC27322-Q1
1
FEATURES
2
Qualified for Automotive Applications
Available in Thermally Enhanced MSOP
PowerPAD™ Package With 4.7°C/W θ
JC
Industry-Standard Pinout With Addition of
Enable Function Rated From –40°C to 125°C
High Peak-Current Drive Capability of ±9 A at TrueDrive Output Architecture Using Bipolar
the Miller Plateau Region Using TrueDrive™ and CMOS Transistors in Parallel
Technology
APPLICATIONS
Efficient Constant-Current Sourcing Using a
Unique Bipolar and CMOS Output Stage
Switch-Mode Power Supplies
TTL-/CMOS-Compatible Inputs Independent of
DC/DC Converters
Supply Voltage
Motor Controllers
20-ns Typical Rise and 15-ns Typical Fall
Line Drivers
Times With 10-nF Load
Class-D Switching Amplifiers
Typical Propagation Delay Times of 25 ns With
Pulse Transformer Driver
Input Falling and 35 ns With Input Rising
4-V to 15-V Supply Voltage
DESCRIPTION
The UCC37321/2 family of high-speed drivers delivers 9 A of peak drive current in an industry-standard pinout.
These drivers can drive the largest of MOSFETs for systems requiring extreme Miller current due to high dV/dt
transitions. This eliminates additional external circuits and can replace multiple components to reduce space,
design complexity, and assembly cost. Two standard logic options are offered, inverting (UCC37321) and
noninverting (UCC37322).
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2TrueDrive, PowerPAD are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2010–2012, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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