Flash Memory Datasheet

133X CompactFlash Card

Transcend Information Inc.

 SMART Data Structure

BYTE F / V Decription

0-1 X Revision code

2-361 X Vendor specific

362 V Off line data collection status

363 X Self-test execution status byte

364-365 V Total time in seconds to complete off-line data collection activity

366 X Vendor specific

367 F Off-line data collection capability

368-369 F SMART capability

370 F

Error logging capability

7-1 Reserved

0 1=Device error logging supported

371 X Vendor specific

372 F Short self-test routine recommended polling time (in minutes)

373 F Extended self-test routine recommended polling time (in minutes)

374 F Conveyance self-test routine recommended polling time (in minutes)

375-385 R Reserved

386-395 F Date Code

396 V Number of MU in device (0~n)

397+(n*6) V MU number

398+(n*6) V MU data block

400+(n*6) V MU spare block

401+(n*6) V Init. Bad block

402+(n*6) V Last Defect Bad block ( Newest state)

511 V Data structure checksum

F=the content of the byte is fixed and does not change.

V=the content of the byte is variable and may change depending on the state of the device or

the commands executed by the device.

X=the content of the byte is vendor specific and may be fixed or variable.

R=the content of the byte is reserved and shall be zero.

* 4 Byte value : [MSB] [2] [1] [LSB]

Above technical information is based on CFA standard data and tested to be reliable. However, Transcend makes no

warranty, either expressed or implied, as to its accuracy and assumes no liability in connection with the use of this

product. Transcend reserves the right to make changes in specifications at any time without prior notice.