Datasheet

TEPT5600
www.vishay.com
Vishay Semiconductors
Rev. 1.8, 23-Aug-11
2
Document Number: 84768
For technical questions, contact: detectortechsupport@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Fig. 1 - Power Dissipation Limit vs. Ambient Temperature
Note
Each 4000 piece bag will contain a single group. The label on the bag will indicate which binned group is in the bag. A specific group cannot
be ordered. Production shipments containing multiple bags will likely include multiple groups. Please design accordingly.
0
20
40
60
80
100
120
0 102030405060708090100
21333
R
thJA
= 230 K/W
T
amb
- Ambient Temperature (°C)
P
V
- Power Dissipation (mW)
BASIC CHARACTERISTICS (T
amb
= 25 °C, unless otherwise specified)
PARAMETER TEST CONDITION SYMBOL MIN. TYP. MAX. UNIT
Collector emitter breakdown voltage I
C
= 0.1 mA V
CEO
6V
Collector dark current V
CE
= 5 V, E = 0 I
CEO
350nA
Collector emitter capacitance V
CE
= 0 V, f = 1 MHz, E = 0 C
CEO
16 pF
Photo current
E
v
= 20 lx, CIE illuminant A,
V
CE
= 5 V
I
PCE
25 226.8 μA
E
v
= 100 lx, CIE illuminant A,
V
CE
= 5 V
I
PCE
350 μA
Angle of half sensitivity ± 20 deg
Wavelength of peak sensitivity
p
570 nm
Range of spectral bandwidth
0.5
440 to 800 nm
TYPE DEDICATED CHARACTERISTICS (T
amb
= 25 °C, unless otherwise specified)
PARAMETER TEST CONDITION BINNED GROUP SYMBOL MIN. MAX. UNIT
Photo current
E
V
= 20 lx,
CIE illuminant A,
V
CE
= 5 V, T
amb
= 25 °C
AI
PCE
25 50.4 μA
BI
PCE
41.7 84 μA
CI
PCE
69.4 140 μA
DI
PCE
113.4 226.8 μA