Datasheet
Table Of Contents
- 1. General description
- 2. Features and benefits
- 3. Applications
- 4. Quick reference data
- 5. Ordering information
- 6. Block diagram
- 7. Pinning information
- 8. Functional description
- 8.1 80C51
- 8.2 General purpose IOs configurations
- 8.3 Host interfaces
- 8.4 Power management
- 8.5 Power clock and reset controller
- 8.6 Contactless Interface Unit (CIU)
- 8.6.1 Feature list
- 8.6.2 Simplified block diagram
- 8.6.3 Reader/Writer modes
- 8.6.4 ISO/IEC 18092, ECMA 340 NFCIP-1 operating mode
- 8.6.5 Card operating modes
- 8.6.6 Overall CIU block diagram
- 8.6.7 Transmitter control
- 8.6.8 RF level detector
- 8.6.9 Antenna presence self test
- 8.6.10 Random generator
- 8.6.11 Data mode detector
- 8.6.12 Serial data switch
- 8.6.13 NFC-WI/S2C interface support
- 8.6.14 Hardware support for FeliCa and NFC polling
- 8.6.15 CRC co-processor
- 8.6.16 FIFO buffer
- 8.6.17 CIU_timer
- 8.6.18 Interrupt request system
- 8.6.19 CIU Power Reduction Modes
- 8.6.20 CIU command set
- 8.6.20.1 General description
- 8.6.20.2 General behavior
- 8.6.20.3 Commands overview
- 8.6.20.4 Idle command
- 8.6.20.5 Config command
- 8.6.20.6 Generate RandomID command
- 8.6.20.7 CalcCRC command
- 8.6.20.8 Transmit command
- 8.6.20.9 NoCmdChange command
- 8.6.20.10 Receive command
- 8.6.20.11 Transceive command
- 8.6.20.12 AutoColl command
- 8.6.20.13 MFAuthent command
- 8.6.20.14 SoftReset command
- 8.6.21 CIU tests signals
- 8.6.22 CIU memory map
- 8.6.23 CIU register description
- 8.6.23.1 CIU register bit behavior
- 8.6.23.2 CIU_SIC_CLK_en register (6330h)
- 8.6.23.3 CIU_Command register (D1h or 6331h)
- 8.6.23.4 CIU_CommIEn register (D2h or 6332h)
- 8.6.23.5 CIU_DivIEn register (D3h or 6333h)
- 8.6.23.6 CIU_CommIrq register (D4h or 6334h)
- 8.6.23.7 CIU_DivIrq register (D5h or 6335h)
- 8.6.23.8 CIU_Error register (D6h or 6336h)
- 8.6.23.9 CIU_Status1 register (DFh or 6337h)
- 8.6.23.10 CIU_Status2 register (E9h or 6338h)
- 8.6.23.11 CIU_FIFOData register (EAh or 6339h)
- 8.6.23.12 CIU_FIFOLevel register (EBh or 633Ah)
- 8.6.23.13 CIU_WaterLevel register (ECh or 633Bh)
- 8.6.23.14 CIU_Control register (EDh or 633Ch)
- 8.6.23.15 CIU_BitFraming register (EEh or 633Dh)
- 8.6.23.16 CIU_Coll register (EFh or 633Eh)
- 8.6.23.17 CIU_Mode register (6301h)
- 8.6.23.18 CIU_TxMode register (6302h)
- 8.6.23.19 CIU_RxMode register (6303h)
- 8.6.23.20 CIU_TxControl register (6304h)
- 8.6.23.21 CIU_TxAuto register (6305h)
- 8.6.23.22 CIU_TxSel register (6306h)
- 8.6.23.23 CIU_RxSel register (6307h)
- 8.6.23.24 CIU_RxThreshold register (6308h)
- 8.6.23.25 CIU_Demod register (6309h)
- 8.6.23.26 CIU_FelNFC1 register (630Ah)
- 8.6.23.27 CIU_FelNFC2 register (630Bh)
- 8.6.23.28 CIU_MifNFC register (630Ch)
- 8.6.23.29 CIU_ManualRCV register (630Dh)
- 8.6.23.30 CIU_TypeB register (630Eh)
- 8.6.23.31 CIU_CRCResultMSB register (6311h)
- 8.6.23.32 CIU_CRCResultLSB register (6312h)
- 8.6.23.33 CIU_GsNOff register (6313h)
- 8.6.23.34 CIU_ModWidth register (6314h)
- 8.6.23.35 CIU_TxBitPhase register (6315h)
- 8.6.23.36 CIU_RFCfg register (6316h)
- 8.6.23.37 CIU_GsNOn register (6317h)
- 8.6.23.38 CIU_CWGsP register (6318h)
- 8.6.23.39 CIU_ModGsP register (6319h)
- 8.6.23.40 CIU_TMode register (631Ah)
- 8.6.23.41 CIU_TPrescaler register (631Bh)
- 8.6.23.42 CIU_TReload_hi register (631Ch)
- 8.6.23.43 CIU_TReloadVal_lo register (631Dh)
- 8.6.23.44 CIU_TCounterVal_hi register (631Eh)
- 8.6.23.45 Register CIU_TCounterVal_lo (631Fh)
- 8.6.23.46 CIU_TestSel1 register (6321h)
- 8.6.23.47 CIU_TestSel2 register (6322h)
- 8.6.23.48 CIU_TestPinEn register (6323h)
- 8.6.23.49 CIU_TestPinValue register (6324h)
- 8.6.23.50 CIU_TestBus register (6325h)
- 8.6.23.51 CIU_AutoTest register (6326h)
- 8.6.23.52 CIU_Version register (6327h)
- 8.6.23.53 CIU_AnalogTest register (6328h)
- 8.6.23.54 CIU_TestDAC1 register (6329h)
- 8.6.23.55 CIU_TestDAC2 register (632Ah)
- 8.6.23.56 CIU_TestADC register (632Bh)
- 8.6.23.57 CIU_RFlevelDet register (632Fh)
- 8.7 Registers map
- 9. Limiting values
- 10. Recommended operating conditions
- 11. Thermal characteristics
- 12. Characteristics
- 12.1 Power management characteristics
- 12.2 Overcurrent detection
- 12.3 Current consumption characteristics
- 12.4 Antenna presence self test thresholds
- 12.5 Typical 27.12 MHz Crystal requirements
- 12.6 Pin characteristics for 27.12 MHz XTAL Oscillator (OSCIN, OSCOUT)
- 12.7 RSTPD_N input pin characteristics
- 12.8 Input pin characteristics for I0 and I1
- 12.9 RSTOUT_N output pin characteristics
- 12.10 Input/output characteristics for pin P70_IRQ
- 12.11 Input/output pin characteristics for P30 / UART_RX, P31 / UART_TX, P32_INT0, P33_INT1
- 12.12 Input/output pin characteristics for P34 / SIC_CLK
- 12.13 Input/output pin characteristics for P35
- 12.14 Input pin characteristics for NSS / P50_SCL / HSU_RX
- 12.15 Input/output pin characteristics for MOSI / SDA / HSU_TX
- 12.16 Input/output pin characteristics for MISO / P71 and SCK / P72
- 12.17 Input pin characteristics for SIGIN
- 12.18 Output pin characteristics for SIGOUT
- 12.19 Output pin characteristics for LOADMOD
- 12.20 Input pin characteristics for RX
- 12.21 Output pin characteristics for AUX1/AUX2
- 12.22 Output pin characteristics for TX1/TX2
- 12.23 Timing for Reset and Hard-Power-Down
- 12.24 Timing for the SPI compatible interface
- 12.25 Timing for the I2C interface
- 13. Application information
- 14. Package outline
- 15. Abbreviations
- 16. Revision history
- 17. Legal information
- 18. Contact information
- 19. Contents
PN532_C1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.6 — 28 November 2017
115436 145 of 222
NXP Semiconductors
PN532/C1
Near Field Communication (NFC) controller
8.6.23 CIU register description
8.6.23.1 CIU register bit behavior
Depending of the functionality of a register, the access condition to the bits can vary. The
following table describes the access conditions:
8.6.23.2 CIU_SIC_CLK_en register (6330h)
Enables the use of P34 / SIC_CLK as secure IC clock.
Table 175. Behavior of register bits
Abbreviation Behavior Description
R/W Read and
Write
These bits can be written and read by the 80C51. Since they are used
only for control means, there content is not influenced by internal
state machines, e.g. CIU_CommIEn may be written and read by the
CPU. It will also be read by internal state machines, but never
changed by them.
DY DYnamic These bits can be written and read by the 80C51. Nevertheless, they
may also be written automatically by CIU internal state machines, e.g.
the commands in the CIU_Command register change their values
automatically after their execution.
R Read only These registers hold flags, which value is determined by CIU internal
states only, e.g. the CRCReady register can not be written from
external but shows CIU internal states.
W Write only These registers are used for control means only. They may be written
by the 80C51 but can not be read. Reading these registers returns
always logic 0.
Reserved These registers are not implemented or reserved for NXP testing use.
Table 176. CIU_SIC_CLK_en register (address 6330h) bit allocation
Bit 7 6 5 4 3 2 1 0
Symbol sic_clk_p34_en - - - Errorbusbitenable Errorbusbitsel[2:0]
Reset 0 000 0 000
Access R/W R R R R/W R/W R/W R/W
Table 177. Description of CIU_SIC_CLK_en bits
Bit Symbol Description
7 sic_clk_p34_en Set to logic 1, this bit configures P34 / SIC_CLK to be used as secure
IC clock: SIC_CLK.
Set to logic 0, P34 / SIC_CLK is in normal mode: P34.
6 to 4 - Reserved
3 Errorbusbitenable Set to logic 1, enable the error source selected by Errorbusbitsel on
AUX pads according to SelAux1 and SelAux2 bits (code 1010b).
2 to 0 Errorbusbitsel[2:0] Define the error source on ErrorBusBit:
Value Description
000 selects ProtocollErr on test bus
001 selects ParityErr on test bus
010 selects CRCErr on test bus
011 selects CollErr on test bus
100 selects BufferOvfl on test bus
101 selects RFErr on test bus
110 selects TempErr on test bus
111 selects WrErr on test bus










