User Manual

EN
32 33
Specification
Spectral
engine:
i1
®
technology (holographic diffraction grating with 128 pixel diode array)
Spectral range: 380 - 730 nm
Physical sampling interval: 3.5 nm
Optical resolution: 10 nm
Spectral reporting: 380 nm ... 730 nm in 10 nm steps
Measurement frequency in scanning
mode: 200 measurements per second
Optics:
Measurement geometry: 45º/0º ring illumination optics, ISO 13655:2009
Measurement aperture: 4.5 mm (0.18”) diameter
(effective measurement aperture during scanning is depending on the
patch size and measurement speed)
Illumination spot size: 3.5 mm (0.14”)
Light source: Gas filled Tungsten (illuminant type A)
Reflectance
measurement: spectral reflectance [dimensionless]
Measurement condition: UV excluded Filter - ISO 13655:2009 measurement condition M2
:
Calibration: Manual on external ceramic white reference
Measurement background: white, ISO 13655:2009; for measurements on backup board
Maximal media thickness: 3 mm (0.12”) on backup board
Minimal patch size in scanning mode: 10 x 10 mm (0.39” x 0.39”) (Width x Height)
Inter-Instrument-Agreement: 0.4 ∆E94* average, 1.0 ∆E94* max.
(deviation from X-Rite manufacturing standard at a temperature of 23ºC
(73.4ºF) on 12 BCRA tiles (D50, 2º))
Short-term repeatability: 0.1 ∆E94* on white (D50,2°, mean of 10 measurements every 3 s on
white)
Emission
measurement: spectral radiance [mW/nm/m
2
/sr], luminance [cd/m
2
]
Measurement range: 0.2 - 1200 cd/m
2
on a typical LCD-Monitor
Short-term repeatability: x,y ±0.002 typ. (5000 K, 80 cd/m
2
)
Ambient light
measurement:
spectral irradiance [mW/nm/m
2
], illuminance [lux]
cosine corrected diffusor light measurement head
Interface:
USB 1.1